Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14263| Title: | Noise characterization of sputtered amorphous carbon films |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | doped diamond,silicon |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14263 |
| ISSN: | 0021-8979 |
| Link: | <Go to ISI>://000089813800088 |
| Publisher: | American Institute of Physics |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-2000-Noi.pdf | 300.06 kB | Adobe PDF | View/Open Request a copy |
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