Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/14244
Title: Nanostructural characterization of TiN-Cu films using EXAFS spectroscopy
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών
Keywords: exafs,tin coatings,tin-cu nanocomposite films,superhard,coatings
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/14244
ISSN: 0257-8972
Link: <Go to ISI>://000275692100014
http://ac.els-cdn.com/S0257897209008901/1-s2.0-S0257897209008901-main.pdf?_tid=8af380548754b40b862466d5f30b25eb&acdnat=1339756014_994cc2eb6140d1f192dcf00f64d2090f
Publisher: Elsevier
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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