Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14188| Title: | Microfocus X-ray Scattering Scanning Microscopy for Polymer Applications |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | damage zone,microfocus X-ray scattering,polyamides,SAXS,voids |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14188 |
| Publisher: | Wiley |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Zafeiropoulos-2005-microfocus X-Ray.pdf | 222.81 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
