Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14010| Title: | Growth kinetics of sputtered amorphous carbon thin films: composition studies and phenomenological model |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | carbon,ellipsometry,growth mechanism,x-ray total reflection analysis (xrtf),deposition mechanism,subplantation model,compressive-stress,ion-bombardment,diamond |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14010 |
| ISSN: | 0040-6090 |
| Link: | <Go to ISI>://000165207400009 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-2000-Growth kinetics of sputtered.pdf | 297.84 kB | Adobe PDF | View/Open Request a copy |
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