Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/13788
Title: | Coupling Length Scales for Multiscale Atomistics-Continuum Simulations: Atomistically-Induced Stress Distributions in Si/Si3N4 Nanopixels |
Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/13788 |
Publisher: | The American Physical Society |
Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
File | Description | Size | Format | |
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Lidorikis-2001-Coupling Length Scales .pdf | 224.66 kB | Adobe PDF | View/Open |
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