Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/13660| Title: | X-ray diffuse scattering investigation of thin films |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | x-rays,diffuse scattering,x-ray reflectivity,modeling,boron nitride,carbon,amorphous-carbon films,spectroscopic ellipsometry,surface-roughness,growth-kinetics,density |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/13660 |
| ISSN: | 0921-5107 |
| Link: | <Go to ISI>://000185174800007 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-2003-X-ray diffuse scattering.pdf | 215.79 kB | Adobe PDF | View/Open Request a copy |
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