Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/11132
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dc.contributor.authorKavousianos, X.en
dc.contributor.authorNikolos, D.en
dc.contributor.authorFoukarakis, G.en
dc.contributor.authorGnardellis, T.en
dc.date.accessioned2015-11-24T17:03:07Z-
dc.date.available2015-11-24T17:03:07Z-
dc.identifier.issn0167-9260-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/11132-
dc.rightsDefault Licence-
dc.subjectself-checking circuitsen
dc.subjecttotally self-checking circuitsen
dc.subjectberger codesen
dc.subjectunidirectional errorsen
dc.titleNew efficient totally self-checking Berger code checkersen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate1999-
heal.abstractThis paper presents a new method for designing totally self-checking (TSC) Berger code checkers for any number k of information bits, even for k = 2(r-1), taking into account realistic faults as stuck-at, transistor stuck-open, transistor stuck-on and resistive bridging faults. Double- as well as single-output TSC checkers are given. The proposed single-output TSC Berger code checkers are the first in the open literature. The checkers designed following the proposed method are significantly more efficient, with respect to the required area and speed, than the corresponding already known from the open literature checkers. (C) 1999 Elsevier Science B.V. All rights reserved.en
heal.journalNameIntegration-the Vlsi Journalen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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