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https://olympias.lib.uoi.gr/jspui/handle/123456789/11048Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Tenentes, V. | en |
| dc.contributor.author | Kavousianos, X. | en |
| dc.contributor.author | Kalligeros, E. | en |
| dc.date.accessioned | 2015-11-24T17:02:24Z | - |
| dc.date.available | 2015-11-24T17:02:24Z | - |
| dc.identifier.issn | 0278-0070 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/11048 | - |
| dc.rights | Default Licence | - |
| dc.subject | ip core testing | en |
| dc.subject | linear feedback shift registers (lfsrs) | en |
| dc.subject | test data compression (tdc) | en |
| dc.subject | test set embedding (tse) | en |
| dc.subject | chip | en |
| dc.title | Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | Doi 10.1109/Tcad.2010.2051096 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.publicationDate | 2010 | - |
| heal.abstract | Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods. | en |
| heal.journalName | Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Tenentes-2010-Single and Variable-.pdf | 569.88 kB | Adobe PDF | View/Open Request a copy |
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