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Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/10935
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dc.contributor.authorHaniotakis, T.en
dc.contributor.authorTsiatouhas, Y.en
dc.contributor.authorNikolos, D.en
dc.contributor.authorEfstathiou, C.en
dc.date.accessioned2015-11-24T17:01:30Z-
dc.date.available2015-11-24T17:01:30Z-
dc.identifier.issn1063-8210-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10935-
dc.rightsDefault Licence-
dc.subjectdesign for testabilityen
dc.subjectdomino cmosen
dc.subjectmultiple prechargeen
dc.subjectlogic-circuitsen
dc.subjectcmos logicen
dc.subjectmicroprocessoren
dc.subjectfaultsen
dc.titleTestable designs of multiple precharged Domino circuitsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.primaryDoi 10.1109/Tvlsi.2007.893664-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate2007-
heal.abstractDomino CMOS circuits are an option for speeding up critical units. An inherent problem of Domino logic is that under specific input conditions the charge redistribution between parasitic capacitances at internal nodes of a circuit can violate the noise margins and cause erroneous responses at the output. The dominant solution to this problem is the multiple precharging of the gate's internal nodes. However, the added precharge transistors are not testable for stuck-open faults. Undetectable stuck-open faults at these transistors may cause noise margins reduction and consequently may affect the reliability of the circuit since its operation in the field will be sensitive to environmental factors such as noise. In this paper, we propose new multiple precharging design schemes that enhance Domino circuits' testability with respect to transistor stuck-open and stuck-on faults.en
heal.journalNameIeee Transactions on Very Large Scale Integration (Vlsi) Systemsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
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