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Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/10811
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dc.contributor.authorMatakias, S.en
dc.contributor.authorTsiatouhas, Y.en
dc.contributor.authorArapoyanni, A.en
dc.contributor.authorHaniotakis, T.en
dc.date.accessioned2015-11-24T17:00:46Z-
dc.date.available2015-11-24T17:00:46Z-
dc.identifier.issn0923-8174-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10811-
dc.rightsDefault Licence-
dc.subjectconcurrent testingen
dc.subjectsoft and timing errorsen
dc.subjectmonitoring circuitsen
dc.subjecttime redundancyen
dc.titleA circuit for concurrent detection of soft and timing errors in digital CMOS ICsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate2004-
heal.abstractIn this paper a new circuit for concurrent soft and timing error detection in CMOS ICs is presented. The circuit is based on current mode sense amplifier topologies to provide fast error detection times. After an error has been detected it can be corrected by using a retry cycle.en
heal.journalNameJournal of Electronic Testing-Theory and Applicationsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
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