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Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/10757
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dc.contributor.authorHaniotakis, T.en
dc.contributor.authorTsiatouhas, Y.en
dc.contributor.authorEfstathiou, C.en
dc.contributor.authorNikolos, D.en
dc.date.accessioned2015-11-24T17:00:22Z-
dc.date.available2015-11-24T17:00:22Z-
dc.identifier.issn0020-7217-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10757-
dc.rightsDefault Licence-
dc.subjectstrongly fault-secureen
dc.subjectself-checking checkeren
dc.subjectdisjoint checkersen
dc.subjectefficient designen
dc.subjectcircuitsen
dc.subjectlogicen
dc.titleDomino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkersen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.primaryDoi 10.1080/00207210310001595383-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate2003-
heal.abstractIn this paper we present new strongly code-disjoint (SCD) and strongly fault-secure (SFS) checkers for the 2-out-of-3 and 1-out-of-3 codes. They are implemented in Domino CMOS logic and take into account a comprehensive fault model consisting of stuck-at, transistor stuck-open and transistor stuck-on faults. The proposed checkers are the first known SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers in the open literature that consider the above fault model without suffering from static power consumption.en
heal.journalNameInternational Journal of Electronicsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
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