Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/10735| Title: | A new built-in TPG method for circuits with random pattern resistant faults |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | built-in self-test,test pattern generators,on-a-chip,bist |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/10735 |
| ISSN: | 0278-0070 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2002-A New Built-In TPG Method for Circuits With Random.pdf | 375.57 kB | Adobe PDF | View/Open Request a copy |
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