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Browsing by Author Vourdas, N.

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Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric filmsVourdas, N.; Karadimos, G.; Goustouridis, D.; Gogolides, E.; Boudouvis, A. G.; Tortai, J. H.; Beltsios, K.; Raptis, I.24-Nov-2015-
Thickness-dependent glass transition temperature of thin resist films for high resolution lithographyMarceau, S.; Tortai, J. H.; Tillier, J.; Vourdas, N.; Gogolides, E.; Raptis, I.; Beltsios, K.; van Werden, K.24-Nov-2015-
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