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Browsing by Author Laskarakis, A.

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In situ and real-time ellipsometry diagnostic techniques towards the monitoring of the bonding structure and growth kinetics: silicon oxide coatingsLogothetidis, S.; Laskarakis, A.; Gika, A.; Patsalas, P.24-Nov-2015-
Magnetron sputtered carbon nitride: composition and chemical bonding of as-grown and post-annealed films studied with real-time and in situ diagnostic techniquesGioti, M.; Logothetidis, S.; Patsalas, P.; Laskarakis, A.; Panayiotatos, Y.; Kechagias, V.24-Nov-2015-
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