Browsing by Author Gika, A.
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Title | Author(s) | Issue date | ???itemlist.??? |
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In situ and real-time ellipsometry diagnostic techniques towards the monitoring of the bonding structure and growth kinetics: silicon oxide coatings | Logothetidis, S.; Laskarakis, A.; Gika, A.; Patsalas, P. | 24-Nov-2015 | - |