Browsing by Subject silc
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Title | Author(s) | Issue date | ???itemlist.??? |
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SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stress | Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Galata, S. | 24-Nov-2015 | - |