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Author
2
Haniotakis, T.
2
Nikolos, D.
Subject
1
circuits
1
cmos logic
1
design for testability
1
disjoint checkers
1
domino cmos
1
efficient design
1
faults
1
logic
1
logic-circuits
1
microprocessor
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Item Type
2
journalArticle
Date
1
2007
1
2003
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Testable designs of multiple precharged Domino circuits (Journal article)
Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers (Journal article)