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dc.contributor.authorPatsalas, P.en
dc.contributor.authorLogothetidis, S.en
dc.contributor.authorKelires, P. C.en
dc.date.accessioned2015-11-24T17:38:50Z-
dc.date.available2015-11-24T17:38:50Z-
dc.identifier.issn0925-9635-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/14559-
dc.rightsDefault Licence-
dc.subjectamorphous carbonen
dc.subjectsurface characterizationen
dc.subjectinterface structureen
dc.subjection assisted depositionen
dc.subjectdiamond-like-carbonen
dc.subjectx-ray-reflectivityen
dc.subjectcross-sectional structureen
dc.subjectatomic-force microscopyen
dc.subjectdeposition mechanismen
dc.subjecthydrogenated carbonen
dc.subjectmolecular-dynamicsen
dc.subjectelastic propertiesen
dc.subjectstress-relaxationen
dc.subjectlayered materialsen
dc.titleSurface and interface morphology and structure of amorphous carbon thin and multilayer filmsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.primaryDOI 10.1016/j.diamond.2004.12.039-
heal.identifier.secondary<Go to ISI>://000230064000004-
heal.identifier.secondaryhttp://ac.els-cdn.com/S0925963505000026/1-s2.0-S0925963505000026-main.pdf?_tid=3cc545c63fbe5a31d4b914d6bbbbd7ea&acdnat=1339755917_2539f6206dec34d764e2fb451255f150-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικώνel
heal.publicationDate2005-
heal.abstractWe review the implementation of X-ray reflection (reflectivity and scattering) techniques for the study of amorphous Carbon (a-C, a-C:H, ta-C) thin and multilayer films and in particular in the determination of the film density and surface and interface morphology, which are intrinsically significant for ultra-thin films. We present studies of various a-C and a-C:H films, which include in particular: i) the morphology of a-C/Si interface, ii) the surface morphology and density evolution during sputter growth of a-C, iii) the morphology of the sp(2) -rich a-C/sp(3)- rich a-C interfaces in multilayer a-C films, iv) the universal correlation between the film density and the refractive index of a-C and a-C:H films. We also compare and validate the experimental results with relative results from Monte-Carlo simulations within an empirical potential scheme. The computational results shed light on the atomistic mechanisms determining the structure and morphology of the a-C interfaces between individual sp(2)- and sp(3) -rich a-C layers and between a-C and Si substrates. (c) 2005 Elsevier B.V. All rights reserved.en
heal.publisherElsevieren
heal.journalNameDiamond and Related Materialsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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