Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14100| Title: | Investigation of bilayer period and individual layer thickness of CrN/TiN superlattices by ellipsometry and X-ray techniques |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | tin/crn superlattice coatings,spectroscopic ellipsometry,magnetron sputtering,optical-properties,thin-films,morphology,coatings |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14100 |
| ISSN: | 0257-8972 |
| Link: | <Go to ISI>://000237842300004 http://ac.els-cdn.com/S0257897205012144/1-s2.0-S0257897205012144-main.pdf?_tid=ea0dbc3c5127797a6f9f3adc15d3033f&acdnat=1339755780_5929462f76ff3ddc2296b003f1278907 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Logothetidis-2006-Investigation of bil.pdf | 165.78 kB | Adobe PDF | View/Open Request a copy |
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