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Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/14017
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dc.contributor.authorAslanoglou, X.en
dc.contributor.authorAssimakopoulos, P. A.en
dc.contributor.authorTrapalis, C.en
dc.contributor.authorKordas, G.en
dc.contributor.authorKarakassides, M. A.en
dc.contributor.authorPilakouta, M.en
dc.date.accessioned2015-11-24T17:34:43Z-
dc.date.available2015-11-24T17:34:43Z-
dc.identifier.issn0168-583X-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/14017-
dc.rightsDefault Licence-
dc.subjectbackscatteringen
dc.titleHeavy ion RBS characterization of multilayer coatings deposited through the sol-gel techniqueen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.secondary<Go to ISI>://A1996VN26100121-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικώνel
heal.publicationDate1996-
heal.abstractMultilayer reflecting thin films of the systems ZrO2-SiO2 and TiO2-SiO2 were deposited on glass surfaces using the sol-gel technique. A C-12 beam was utilized in RBS analysis to investigate the inner structure of these multilayer stacks. The layers showed uniform thickness and no evidence for significant diffusion between the layers was found. Optical Spectroscopy showed wavelength selectivity in the reflection of an 8-layer TiO2-SiO2 sample.en
heal.publisherElsevieren
heal.journalNameNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atomsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
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