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https://olympias.lib.uoi.gr/jspui/handle/123456789/13901Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Koutsokeras, L. E. | en |
| dc.contributor.author | Hastas, N. | en |
| dc.contributor.author | Kassavetis, S. | en |
| dc.contributor.author | Valassiades, O. | en |
| dc.contributor.author | Charitidis, C. | en |
| dc.contributor.author | Logothetidis, S. | en |
| dc.contributor.author | Patsalas, P. | en |
| dc.date.accessioned | 2015-11-24T17:33:50Z | - |
| dc.date.available | 2015-11-24T17:33:50Z | - |
| dc.identifier.issn | 0257-8972 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/13901 | - |
| dc.rights | Default Licence | - |
| dc.subject | ternary nitrides | en |
| dc.subject | electrical properties | en |
| dc.subject | optical properties | en |
| dc.subject | work function | en |
| dc.subject | carbide thin-films | en |
| dc.subject | titanium nitride | en |
| dc.subject | work function | en |
| dc.subject | contacts | en |
| dc.title | Electronic properties of binary and ternary, hard and refractory transition metal nitrides | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | DOI 10.1016/j.surfcoat.2009.10.046 | - |
| heal.identifier.secondary | <Go to ISI>://000275692100035 | - |
| heal.identifier.secondary | http://ac.els-cdn.com/S0257897209008548/1-s2.0-S0257897209008548-main.pdf?_tid=0beef21afc46989aa4bc3278c7dd4c9b&acdnat=1339755612_1a3517772d1ffd1425ff3d2af584400a | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών | el |
| heal.publicationDate | 2010 | - |
| heal.abstract | We present a detailed study of the microstructure and morphology of a very wide variety of binary transition metal nitrides (TiN, ZrN and TaN) grown by pulsed laser deposition (PLD) as well as of ternary nitrides consisting of Ti alloyed with Ta or Zr. We also present a critical investigation of their electronic properties such as the plasma energy, electrical resistivity and work function, with respect to their composition, microstructure and the electronic structure of the constituent metals using optical reflectance spectroscopy, Hall effect and Kelvin probe measurements. (C) 2009 Elsevier B.V. All rights reserved. | en |
| heal.publisher | Elsevier | en |
| heal.journalName | Surface & Coatings Technology | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Koutsokeras-2010-Electronic propertie.pdf | 433.81 kB | Adobe PDF | View/Open Request a copy |
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