Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Item Type
Advanced Search
Help
About DSpace
Sign on to:
My DSpace
Receive email
updates
Edit Profile
Saved Searches
Favorites
Repository of UOI "Olympias"
Repository of OAI
Saved Searches
Save this search
Go!
Discover
Author
4
Chakrabarty, K.
2
Kalligeros, E.
2
Tenentes, V.
2
Tsiatouhas, Y.
1
Floros, A.
1
Jain, A.
1
Parekhji, R.
1
Zhang, Z.
Subject
2
defect-oriented testing
1
-
1
chip
1
Complexity theory
1
core switches
1
Core-based testing
1
defect screening
1
dynamic reseeding
1
dynamic voltage scaling
1
embedded testing
.
next >
Item Type
5
journalArticle
1
bookChapter
Date
1
2013
1
2012
2
2011
2
2010
Search
Search:
All of DSpace
ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
Άρθρα σε επιστημονικά περιοδικά (Κλειστά)
Διατριβές Μεταπτυχιακής Έρευνας (Masters) - ΜΥ
Διδακτορικές Διατριβές
Μονογραφίες ( Ανοικτές)
Μονογραφίες ( Κλειστές)
Ομιλίες σε Συνέδριο
Σημειώσεις Μαθημάτων
Φοιτητικές Εργασίες
for
Search only items with full text availability
Current filters:
Title
Author
Subject
Date Issued
Item Type
Date
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Item Type
Date
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Clear current filters
or
Add more filters
Title
Author
Subject
Date Issued
Item Type
Date
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
View Option
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort items by
Relevance
Title
Issue Date
In order
Ascending
Descending
Authors/record
All
1
5
10
15
20
25
30
35
40
45
50
Results 1-6 of 6 (Search time: 0.057 seconds).
previous
1
next
Timing error detection and correction by time dilation (Book chapter)
Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands (Journal article)
Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores (Journal article)
Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches (Journal article)
Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects (Journal article)
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets (Journal article)