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Browsing by Author Rahman, M. S.

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Showing results 1 to 7 of 7

Title	Author(s)	Issue date	???itemlist.???
Anomalous charge trapping dynamics in cerium oxide grown on germanium substrate	Rahman, M. S.; Evangelou, E. K.; Dimoulas, A.; Mavrou, G.; Galata, S.	24-Nov-2015	-
Current instabilities in rare-earth oxides-HfO(2) gate stacks grown on germanium based metal-oxide-semiconductor devices due to Maxwell-Wagner instabilities and dielectrics relaxation	Rahman, M. S.; Evangelou, E. K.; Dimoulas, A.; Mavrou, G.; Galata, S.	24-Nov-2015	-
Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates	Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.	24-Nov-2015	-
Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO(2)/Dy(2)O(3) gate stacks grown on Ge (100) substrates	Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Tsipas, P.	24-Nov-2015	-
SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stress	Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Galata, S.	24-Nov-2015	-
Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substrates	Evangelou, E. K.; Rahman, M. S.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Giannakopoulos, K. P.; Anagnostopoulos, D. F.; Valicu, R.; Borchert, G. L.	24-Nov-2015	-
Study of stress-induced leakage current (SILC) in HfO(2)/Dy(2)O(3) high-kappa gate stacks on germanium	Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.	24-Nov-2015	-

Showing results 1 to 7 of 7