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Author
11
Kavousianos, X.
6
Kalligeros, E.
4
Bakalis, D.
4
Haniotakis, T.
4
Tsiatouhas, Y.
2
Efstathiou, C.
2
Vergos, H. T.
1
Alexiou, G. P.
1
Arapoyanni, A.
1
Dimakopoulos, V. V.
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Subject
7
circuits
4
a-chip test
3
built-in self-test
3
codes
3
design
3
embedded testing techniques
3
huffman encoding
3
pattern generation
3
power
2
bist
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Item Type
16
journalArticle
Date
14
2000 - 2009
2
1995 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
Άρθρα σε επιστημονικά περιοδικά (Κλειστά)
Διατριβές Μεταπτυχιακής Έρευνας (Masters) - ΜΥ
Διδακτορικές Διατριβές
Μονογραφίες ( Ανοικτές)
Μονογραφίες ( Κλειστές)
Ομιλίες σε Συνέδριο
Σημειώσεις Μαθημάτων
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New efficient totally self-checking Berger code checkers (Journal article)
Novel single and double output TSC CMOS checkers for m-out-of-n codes (Journal article)
Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing (Journal article)
Multilevel Huffman coding: An efficient test-data compression method for IP cores (Journal article)
Multilevel-Huffman test-data compression for IP cores with multiple scan chains (Journal article)
Low power built-in self-test schemes for array and booth multipliers (Journal article)
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST (Journal article)
A new built-in TPG method for circuits with random pattern resistant faults (Journal article)
Path delay fault testing of multiplexer-based shifters (Journal article)
On TSC Checkers for m-out-of-n Codes (Journal article)