| Title | Author(s) | Issue date | ???itemlist.??? |
| Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers | Haniotakis, T.; Tsiatouhas, Y.; Efstathiou, C.; Nikolos, D. | 24-Nov-2015 | - |
| Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing | Kavousianos, X.; Bakalis, D.; Nikolos, D. | 24-Nov-2015 | - |
| Low power built-in self-test schemes for array and booth multipliers | Bakalis, D.; Kavousianos, X.; Vergos, H. T.; Nikolos, D.; Alexiou, G. P. | 24-Nov-2015 | - |
| Multilevel Huffman coding: An efficient test-data compression method for IP cores | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Multilevel-Huffman test-data compression for IP cores with multiple scan chains | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Multiphase BIST: A new reseeding technique for high test-data compression | Kalligeros, E.; Kavousianos, X.; Nikolos, D. | 24-Nov-2015 | - |
| A new built-in TPG method for circuits with random pattern resistant faults | Kavousianos, X.; Bakalis, D.; Nikolos, D.; Tragoudas, S. | 24-Nov-2015 | - |
| New efficient totally self-checking Berger code checkers | Kavousianos, X.; Nikolos, D.; Foukarakis, G.; Gnardellis, T. | 24-Nov-2015 | - |
| A new technique for I(DDQ) testing in nanometer technologies | Tsiatouhas, Y.; Moisiadis, Y.; Haniotakis, T.; Nikolos, D.; Arapoyanni, A. | 24-Nov-2015 | - |
| Novel single and double output TSC CMOS checkers for m-out-of-n codes | Kavousianos, X.; Nikolos, D.; Sidiropoulos, G. | 24-Nov-2015 | - |
| On TSC Checkers for m-out-of-n Codes | Dimakopoulos, V. V.; Sourtziotis, G; Nikolos, D.; Paschalis A. | 24-Nov-2015 | - |
| On-the-fly reseeding: A new reseeding technique for test-per-clock BIST | Kalligeros, E.; Kavousianos, X.; Bakalis, D.; Nikolos, D. | 24-Nov-2015 | - |
| Optimal selective Huffman coding for test-data compression | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Path delay fault testing of multiplexer-based shifters | Vergos, H. T.; Tsiatouhas, Y.; Haniotakis, T.; Nikolos, D.; Nicolaidis, M. | 24-Nov-2015 | - |
| Test data compression based on variable-to-variable Huffman encoding with codeword reusability | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Testable designs of multiple precharged Domino circuits | Haniotakis, T.; Tsiatouhas, Y.; Nikolos, D.; Efstathiou, C. | 24-Nov-2015 | - |
