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Browsing by Author Mavrou, G.

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Showing results 3 to 8 of 8 < previous 
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Electrical properties of La(2)O(3) and HfO(2)/La(2)O(3) gate dielectrics for germanium metal-oxide-semiconductor devicesMavrou, G.; Galata, S.; Tsipas, P.; Sotiropoulos, A.; Panayiotatos, Y.; Dirnoulas, A.; Evangelou, E. K.; Seo, J. W.; Dieker, C.24-Nov-2015-
Germanium metal-insulator-semiconductor capacitors with rare earth La2O3 gate dielectricMavrou, G.; Galata, S. F.; Sotiropoulos, A.; Tsipas, P.; Panayiotatos, Y.; Dimoulas, A.; Evangelou, E. K.; Seo, J. W.; Dieker, C.24-Nov-2015-
Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO(2)/Dy(2)O(3) gate stacks grown on Ge (100) substratesRahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Tsipas, P.24-Nov-2015-
Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd(2)O(3)/Ge capacitorsEvangelou, E. K.; Mavrou, G.; DimoulaS, A.; Konofaos, N.24-Nov-2015-
SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stressRahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Galata, S.24-Nov-2015-
Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substratesEvangelou, E. K.; Rahman, M. S.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Giannakopoulos, K. P.; Anagnostopoulos, D. F.; Valicu, R.; Borchert, G. L.24-Nov-2015-
Showing results 3 to 8 of 8 < previous