Browsing by Author Evangelou, E. K.

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Showing results 13 to 17 of 17 < previous 
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Post deposition annealing studies of lanthanum aluminate and ceria high-k dielectrics on germaniumGalata, S. F.; Evangelou, E. K.; Panayiotatos, Y.; Sotiropoulos, A.; Dimoulas, A.24-Nov-2015-
Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd(2)O(3)/Ge capacitorsEvangelou, E. K.; Mavrou, G.; DimoulaS, A.; Konofaos, N.24-Nov-2015-
SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stressRahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Galata, S.24-Nov-2015-
Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substratesEvangelou, E. K.; Rahman, M. S.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Giannakopoulos, K. P.; Anagnostopoulos, D. F.; Valicu, R.; Borchert, G. L.24-Nov-2015-
Study of stress-induced leakage current (SILC) in HfO(2)/Dy(2)O(3) high-kappa gate stacks on germaniumRahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.24-Nov-2015-