| Title | Author(s) | Issue date | ???itemlist.??? |
| Anomalous charge trapping dynamics in cerium oxide grown on germanium substrate | Rahman, M. S.; Evangelou, E. K.; Dimoulas, A.; Mavrou, G.; Galata, S. | 24-Nov-2015 | - |
| Characterization of BaTiO3 thin films on p-Si | Evangelou, E. K.; Konofaos, N.; Aslanoglou, X.; Kennou, S.; Thomas, C. B. | 24-Nov-2015 | - |
| Characterization of BaTiO3 thin films on p-Si | Evangelou, E. K.; Konofaos, N.; Aslanoglou, X.; Kennou, S.; Thomas, C. B. | 24-Nov-2015 | - |
| Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices | Evangelou, E. K.; Konofaos, N.; Aslanoglou, X. A.; Dimitriadis, C. A.; Patsalas, P.; Logothetidis, S.; Kokkoris, M.; Kossionides, E.; Vlastou, R.; Groetschel, R. | 24-Nov-2015 | - |
| Current instabilities in rare-earth oxides-HfO(2) gate stacks grown on germanium based metal-oxide-semiconductor devices due to Maxwell-Wagner instabilities and dielectrics relaxation | Rahman, M. S.; Evangelou, E. K.; Dimoulas, A.; Mavrou, G.; Galata, S. | 24-Nov-2015 | - |
| Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates | Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A. | 24-Nov-2015 | - |
| Dielectric properties and electronic transitions of porous and nanostructured cerium oxide films | Logothetidis, S.; Patsalas, P.; Evangelou, E. K.; Konofaos, N.; Tsiaoussis, I.; Frangis, N. | 24-Nov-2015 | - |
| Dielectric properties of CVD grown SiON thin films on Si for MOS microelectronic devices | Konofaos, N.; Evangelou, E. K.; Aslanoglou, X.; Kokkoris, M.; Vlastou, R. | 24-Nov-2015 | - |
| Electrical properties of La(2)O(3) and HfO(2)/La(2)O(3) gate dielectrics for germanium metal-oxide-semiconductor devices | Mavrou, G.; Galata, S.; Tsipas, P.; Sotiropoulos, A.; Panayiotatos, Y.; Dirnoulas, A.; Evangelou, E. K.; Seo, J. W.; Dieker, C. | 24-Nov-2015 | - |
| Fermi-level pinning and charge neutrality level in germanium | Dimoulas, A.; Tsipas, P.; Sotiropoulos, A.; Evangelou, E. K. | 24-Nov-2015 | - |
| Germanium metal-insulator-semiconductor capacitors with rare earth La2O3 gate dielectric | Mavrou, G.; Galata, S. F.; Sotiropoulos, A.; Tsipas, P.; Panayiotatos, Y.; Dimoulas, A.; Evangelou, E. K.; Seo, J. W.; Dieker, C. | 24-Nov-2015 | - |
| Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO(2)/Dy(2)O(3) gate stacks grown on Ge (100) substrates | Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Tsipas, P. | 24-Nov-2015 | - |
| Post deposition annealing studies of lanthanum aluminate and ceria high-k dielectrics on germanium | Galata, S. F.; Evangelou, E. K.; Panayiotatos, Y.; Sotiropoulos, A.; Dimoulas, A. | 24-Nov-2015 | - |
| Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd(2)O(3)/Ge capacitors | Evangelou, E. K.; Mavrou, G.; DimoulaS, A.; Konofaos, N. | 24-Nov-2015 | - |
| SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stress | Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Galata, S. | 24-Nov-2015 | - |
| Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substrates | Evangelou, E. K.; Rahman, M. S.; Androulidakis, I. I.; Dimoulas, A.; Mavrou, G.; Giannakopoulos, K. P.; Anagnostopoulos, D. F.; Valicu, R.; Borchert, G. L. | 24-Nov-2015 | - |
| Study of stress-induced leakage current (SILC) in HfO(2)/Dy(2)O(3) high-kappa gate stacks on germanium | Rahman, M. S.; Evangelou, E. K.; Androulidakis, I. I.; Dimoulas, A. | 24-Nov-2015 | - |
