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Nikolos, D.
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Kalligeros, E.
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Bakalis, D.
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Tenentes, V.
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Tsiatouhas, Y.
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Alexiou, G. P.
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Floros, A.
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Fudos, I.
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circuits
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a-chip test
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built-in self-test
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codes
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embedded testing techniques
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huffman encoding
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pattern generation
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power
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bist
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17
journalArticle
1
bookChapter
Date
6
2010 - 2013
11
2000 - 2009
1
1999 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Timing error detection and correction by time dilation (Book chapter)
Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands (Journal article)
Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores (Journal article)
Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches (Journal article)
Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects (Journal article)
New efficient totally self-checking Berger code checkers (Journal article)
Novel single and double output TSC CMOS checkers for m-out-of-n codes (Journal article)
Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing (Journal article)
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets (Journal article)
Multilevel Huffman coding: An efficient test-data compression method for IP cores (Journal article)