Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/17270| Title: | Rare-earth silicide thin film study. Comparison of heavy ion and conventional RBS |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/17270 |
| ISSN: | 0042-207X |
| Link: | http://www.sciencedirect.com/science/article/pii/0042207X9390009Y |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| aslanoglou-1993-Rare-earth silicide thin film study. Comparison of heavy ion and conventional RBS.pdf | 282.62 kB | Adobe PDF | View/Open Request a copy |
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