Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/15809| Title: | Characterization of BaTiO3 thin films on p-Si |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών |
| Keywords: | actfel devices,xps,rbs,batio3 films,barium-titanate,silicon,states |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/15809 |
| ISSN: | 1369-8001 |
| Link: | <Go to ISI>://000167727200071 http://ac.els-cdn.com/S1369800100001098/1-s2.0-S1369800100001098-main.pdf?_tid=d18745192a9f2843bdc8bd85091c0048&acdnat=1334134339_6b5c0aa2facfe658eec10eba93c3bca2 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Evangelou-2001-Characterization of.pdf | 129.59 kB | Adobe PDF | View/Open Request a copy |
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