Heavy ion RBS characterization of multilayer coatings deposited through the sol-gel technique (Journal article)

Aslanoglou, X./ Assimakopoulos, P. A./ Trapalis, C./ Kordas, G./ Karakassides, M. A./ Pilakouta, M.

Multilayer reflecting thin films of the systems ZrO2-SiO2 and TiO2-SiO2 were deposited on glass surfaces using the sol-gel technique. A C-12 beam was utilized in RBS analysis to investigate the inner structure of these multilayer stacks. The layers showed uniform thickness and no evidence for significant diffusion between the layers was found. Optical Spectroscopy showed wavelength selectivity in the reflection of an 8-layer TiO2-SiO2 sample.
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών
Keywords: backscattering
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/14017
ISSN: 0168-583X
Link: <Go to ISI>://A1996VN26100121
Publisher: Elsevier
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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