Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/10792
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dc.contributor.authorDermentzoglou, L.en
dc.contributor.authorTsiatouhas, Y.en
dc.contributor.authorArapoyanni, A.en
dc.date.accessioned2015-11-24T17:00:37Z-
dc.date.available2015-11-24T17:00:37Z-
dc.identifier.issn0923-8174-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/10792-
dc.rightsDefault Licence-
dc.subjectvoltage controlled oscillator (vcos)en
dc.subjectdesign for testability (dft)en
dc.subjectradio frequency (rf) testingen
dc.titleA design for testability scheme for CMOS LC-Tank voltage controlled oscillatorsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate2004-
heal.abstractIn this paper, anew Design for Testability (DFT) scheme is proposed, for the testing of LC-tank CMOS Voltage Controlled Oscillators (VCOs). The proposed test-circuit is capable of detecting hard (catastrophic) and soft (parametric) faults, injected in the VCO. The test result is provided by a digital Fail/Pass signal. Simulation results reveal the effectiveness of the proposed circuit. The overall silicon area requirement of the proposed DFT scheme is negligible.en
heal.journalNameJournal of Electronic Testing-Theory and Applicationsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)



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