Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/10746| Title: | A new technique for I(DDQ) testing in nanometer technologies |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | i(ddq) testing,current monitoring,design for testability,submicron cmos,circuits,design,future,issues |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/10746 |
| ISSN: | 0167-9260 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| tsiatouhas-2002-A new technique for I(DDQ) testing in nanometer technologies.pdf | 193.6 kB | Adobe PDF | View/Open Request a copy |
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