Browsing by Author Kalligeros, E.

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Showing results 1 to 8 of 8
TitleAuthor(s)Issue date???itemlist.???
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test SetsKavousianos, X.; Tenentes, V.; Chakrabarty, K.; Kalligeros, E.24-Nov-2015-
Multilevel Huffman coding: An efficient test-data compression method for IP coresKavousianos, X.; Kalligeros, E.; Nikolos, D.24-Nov-2015-
Multilevel-Huffman test-data compression for IP cores with multiple scan chainsKavousianos, X.; Kalligeros, E.; Nikolos, D.24-Nov-2015-
Multiphase BIST: A new reseeding technique for high test-data compressionKalligeros, E.; Kavousianos, X.; Nikolos, D.24-Nov-2015-
On-the-fly reseeding: A new reseeding technique for test-per-clock BISTKalligeros, E.; Kavousianos, X.; Bakalis, D.; Nikolos, D.24-Nov-2015-
Optimal selective Huffman coding for test-data compressionKavousianos, X.; Kalligeros, E.; Nikolos, D.24-Nov-2015-
Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP CoresTenentes, V.; Kavousianos, X.; Kalligeros, E.24-Nov-2015-
Test data compression based on variable-to-variable Huffman encoding with codeword reusabilityKavousianos, X.; Kalligeros, E.; Nikolos, D.24-Nov-2015-